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This book presents x-ray and neutron reflectometry techniques and how they can unravel interface structures and magnetism at the mesoscopic length scale in thin films and multilayers. The aim is to introduce the reader to neutron and x-ray reflectometry in general with an emphasis on polarized neutron reflectometry for magnetic properties that are strongly affected by interface characteristics. The field of ultra-thin films, a subgroup of nanomaterials, has seen a huge upsurge since the 1990s. The Nobel prize for the discovery of giant magnetoresistance stands witness to the importance of tunable magnetic coupling between magnetic layers. At present, a very large number of studies are being carried out towards designing thin film heterostructures and understanding their structure, composition, and magnetism at interfaces, targeting the discovery of novel materials. Emerging properties and magnetism at the interfaces in such heterostructures are of deep research and application interest. This book is an attempt to demonstrate the important role of neutron (and x-ray) reflectivity measurements in understanding such properties. Introduction Theory of neutron reflectometry Understanding emerging phenomena at interfaces using specular neutron and x-ray reflectometry Correlation of interface morphology and magnetism in heterostructures: off-specular (diffuse) scattering Summary and outlook